Leica EM BAF060
The Leica EM BAF060 is a high-end sample preparation system for freeze fracturing, etching, and freeze drying of double replica, high resolution carbon/metal mix coatings for TEM and SEM analysis, which features an advanced microtome, flexible shadowing options with two independent electron beam sources and a load-lock transfer system.
Previous:Transmission electron microscope (TEM)
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